Telcordia software to calculate the reliability prediction of electronic equipment based on the Telcordia (Bellcore) TR and SR standards. Free trial. Telcordia Telecom Information SuperStore – Reliability Prediction Procedure for The following documents were fully or partly replaced by SR TR Bellcore TR – Download as PDF File .pdf), Text File .txt) or read online.
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Time plot and the calculated B10 life for the analysis.
With this method, belcore test is conducted on a sufficiently large sample of units operating under normal usage conditions. The activation energy is usually related to certain failure mechanisms and failure modes, and can be determined by correlating thermal cycling test data and the Coffin-Manson model.
Predictions based on field data The Telcordia standard also documents a recommended method for predicting serial system hardware reliability.
Figure 5 ebllcore the reliability plot and the estimated B10 life at the usage temperature level. Users can construct hierarchical breakdowns of systems t-332 no restrictions on block numbers or levels of indenture. This valuable feature comes in especially handy when it is necessary to transfer data from one project or library to another.
Empirical prediction methods are based on models developed from statistical curve fitting of historical failure data, which may have been collected in the field, in-house or from manufacturers. Among these approaches, three main categories are often used within government and industry: The system’s failure rate is equal to the sum of the failure rates of the components involved.
Tables needed to facilitate the calculation of reliability predictions.
These powerful facilities transfer as much of the available information as possible, saving you valuable time and effort. After the analysis is complete, ITEM ToolKit’s integrated environment comes into its own with powerful conversion facilities for transferring data to other modules of the program.
Some have gained popularity within industry in the past three decades. This lends the procedure and the predictions derived from it a high level of credibility free from the bias of any individual supplier or service provider.
Numerous experiments with different stress conditions have been reported in the literature, where the values have been reported in the range between 2 and 3. Method III is a statistical prediction of failure rate based on field tracking data collected in accordance with specific SR criteria.
SR – Reliability Prediction Procedure | Telcordia
The Turnover Point,” Proc. Since electronic products usually have a long time period of useful life i. So the result of 0. Electronic devices with aluminum or aluminum alloy with small percentages of copper and silicon metallization are subject to corrosion failures and therefore can be described with the following model :.
The empirical or standards based methods can be used in the design stage to quickly obtain a rough estimation of product reliability. The standard provides the generic failure rates and three part stress factors: This procedure also documents a recommended method for predicting serial system hardware reliability.
Figure 4 shows the data and calculated parameters. These predictions provide necessary input to system-level reliability models for predicting expected downtime per year and system availability. As mentioned above, time-to-failure data from life testing may be incorporated into some of the empirical prediction standards i.
Next, we will discuss physics of failure methods, which are based on root-cause analysis of failure mechanisms, failure modes and stresses. Telcordia continues to revise and update the standard. In contrast to empirical reliability prediction methods, which are based on the statistical analysis of historical failure data, a physics of bellocre approach is based on the understanding of the failure mechanism and applying the physics bellcre failure model to the data.
Finally, we will discuss life testing methods, which are used to determine reliability by testing a relatively large number of samples at their specified operation stresses or higher stresses and using statistical models to analyze the data.
The table below lists some bellcorre the available prediction standards and the following sections describe two of the most commonly used methods in a bit more detail. Empirical or Standards Based Prediction Methods Empirical prediction methods are based on models developed from statistical curve fitting of historical failure data, which may have been collected in the field, in-house or from manufacturers. The usage temperature level is Kelvin.
The Telcordia Reliability Prediction Procedure has a long and distinguished history of use within and outside the telecommunications industry. These standards use a series td-332 models for various categories of electronic, electrical and electro-mechanical components to predict steady-state failure rates which environmental conditions, quality levels, electrical stress conditions and various other parameters affect.
According to different physics of failure mechanisms, one more term i. It can also be used directly by telecommunications service providers for product reliability evaluation.